Professor Jim Williams

 

Director, RSPhysSE, ANU Address: Building# 60, Oliphant Building The Research School of Physical Sciences and Engineering ANU Campus Canberra ACT 0200 Phone: +61 2 612 52476 Fax: +61 2 6125 5457 Email: jsw109@rsphysse.anu.edu.au Webpage: http://wwwrsphysse.anu.edu.au/admin/php/director.php Research Group: ANU, RSPhysSE, Electronic Materials Engineering (EME)

 

Role in the network

Experienced Researcher (ER)  

Materials Research Focus

Materials drivers for high tech IT, communications and sensor applications  

Current Research Activities

Semiconductor processing and characterisaton for electronic and optoelectronic applications: ion implantation, nano-indentation, phase changes, defects and impurities in semiconductors  

Selected Publications

External Publication List

J.S. Williams, B. Haberl, J.E. Bradby
Nanoindentation of ion implanted and deposited amorphous silicon
Mat. Res. Soc. Symp. Proc. Vol 841, Boston, USA. Mat. Res. Soc. (2005) R10.3.1/T6.3.1

B. Haberl, J.E. Bradby, M.V. Swain, J.S. Williams, P. Munroe
Phase transformations induced in relaxed amorphous silicon by indentation at room temperature
Applied Physics Letters 85 (2004) 5559

J.E. Bradby, J.S. Williams, M. V. Swain
Pop-in events induced by spherical indentation in compound semiconductors
Journal of Materials Research 19 (2004) 380

J.E. Bradby, J.S. Williams, M.V. Swain
In situ characterization of phase transformations in Si during indentation
Physical Review B 67 (2003) 085205-1-9

M.-O. Ruault, M.C. Ridgway, F. Fortuna, H. Bernas, J.S. Williams
In-situ microscopy study of nanocavity shrinkage in Si under ion beam irradiation
The European Physical Journal of Applied Physics 23 (2003) 39-40  

Membership/Fellowship of Key Organisations

FAA, FTSE, FAIP, FEIAust  

Awards and Distinctions

Boas Medal of AIP (1992)  

Professional Recognition and Outreach

7 international journal editorial boards
5 conference or conference series advisory boards
Council of Materials Research Society
Office bearer of the International Union of Materials Research Societies
Boards of 2 companies, 2 CRCs and 1 SRC  

International Linkages

USA, Japan, France, Germany, UK, Taiwan, Brazil, Russia

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